Visit Gamma Scientific in booth 919 during SVC TechCon on April 28th and 29th at the Santa Clara Convention Center in Santa Clara, CA. We will be demonstrating our Thin Film Measurement Systems which allow you to complete your inspections faster and maximize production line uptime.
Gamma Scientific has announced the release of their new Automated Reflectometer Systems for measuring isolated first surface reflectance of thin film coatings on display glass.
Gamma Scientific’s Thin Film Measurement Systems provide isolated first surface measurement of anti-reflection coatings on substrates down to 0.5 mm thick. Our unique technology allows manufacturers to perform single sided inspection on the first surface of any glass or polished, transmissive element while excluding the second surface.
Visit Gamma Scientific in Booth 633 at SID Display Week to see live demonstrations of our new Thin Film Measurement Systems.