Reflectance Test System

 

Visit Gamma Scientific in Booth 633 at SID Display Week to see live demonstrations of our new Thin Film Measurement Systems.

Display Week 2013 is being held at the Vancouver Convention Centre in Vancouver, Canada from May 21-23, 2013.

Isolated First Surface Testing of AR Coatings

Our Thin Film Measurement systems provide isolated first surface measurement of anti-reflection coatings on substrates down to 0.5mm thick.

The unique design of our instruments allows manufacturers to perform single sided inspection on the first surface of any glass of polished, transmissive element while excluding the second surface. This application has been optimized for testing anti-reflection coating on display glass for flat panel monitors, tablets and mobile phones.

Thin Film Measurement PDF

Gamma Scientific thin film test systems are available as fully-automated, semi-automatic and handheld solutions which can be custom built for your specific testing application.

Each system uses a Gamma Scientific RadOMA spectroradiometer to measure complete spectral and colorimetric properties with a scan time of less than 0.2 seconds.

To see live demonstrations please visit us in Booth 633 at Display Week or contact us for a free consultation today.

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