GS-191-SA-1045 Semi-Auto Reflectance Measurement System

This semi-automatic gonio-reflectance measurement system automatically captures complete spectral & colorimetric properties at 0° and 45° angle of incidence simultaneously, for coated glass, polished substrates or diffuse surfaces without requiring second-surface masking. Substrates as thin as 500 µm can be tested with typical scan times of 200 msec per measurement point. 

Based on high precision spectroradiometric instrumentation,  proprietary measurement techniques and expertise in low-light measurement technology developed by Gamma Scientific, the product range features industry-leading accuracy, repeatability and throughput, including both refractive index determination and thin film coating thickness.

 

Applications

  • Anti-reflectance coating characterization
  • Flat-panel display glass testing
  • Touchscreen display glass testing
  • Optical filter / lens testing
  • Pyrolytic glass coating test & characterization
  • Characterization of flat panel displays, photovoltaic coatings, low-E architectural coatings, paint samples and diffuse plastics
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Highly Accurate & Repeatable Reflection Measurements

  • Nondestructively capture complete spectral and colorimetric properties with scan times as short as 200 msec per measurement point
  • Isolated first-surface measurement of thin glass substrates down to 500 µm in thickness without requiring second-surface masking
  • Measure total reflectance or isolate internal optical interfaces
  • Test capability for diffuse or specular surfaces
  • Programmable, multi-location measurement, pass/fail criteria settings and binning capabilities
  • Configuration options including handheld, semi-automatic and fully automatic rotary systems with robotic loading

In addition to our exceptional technical and functional capabilities, Gamma Scientific is ISO/IEC 17025 accredited by NVLAP (NVLAP lab code 200823-0).

Optical Specifications

191 Optical Head

(Optional Geometries of 0° and 20°)

10 Degree Angle of Incidence

45 Degree Angle of Incidence

Measurement Time

First surface specular reflection

First surface specular reflection

Sample Types

Glass

Glass

Illumination Angle

10°

45°

Viewing Angle

10°

45°

Maximum Sample Thickness

(first-surface reflectance only)

0.5 mm (transparent samples)

0.25 mm (transparent samples)

Maximum Sample Thickness

6 mm

6 mm

Maximum Sample Size

400 mm x 350 mm

400 mm x 350 mm

Spectral Range

360 to 830 nm

360 to 830 nm

Illumination Spot Size (sample area)

1 mm x 10 µm

1 mm x 10 µm

Measurement Speed (typical)

< 1500 msec

< 1500 msec

Calibration Reference Standard

Integral BK-7 polished glass

Integral BK-7 polished glass

Spectral Reflectance

± 0.5%

± 0.5%

Tristimulus (CIE 1931 X,Y,Z)

± 0.05

± 0.10

Chromaticity (CIE 1931 x,y)

± 0.005

± 0.005

LAB Color (CIE 1976 L*, a*, b*)

L ± 2.0                       a*, b* ± 0.8

L ± 2.0                       a*, b* ± 0.8

Average Reflectance

± 0.2

± 0.2

 

 

System Specifications

191 Optical Head

191F-1045 Dual Angle Optics

Measurement Program Types

(all measured @ 10° & 45° simultaneously)

5 selectable program types, individually configurable for up to 10 different panel sizes:

40-point grid; 25-point grid; 5-point cross, 3-point diagonal; single-point

Measurement Locations

Position coordinates can be individually set for 10 panel sizes with 1 mm resolution

Default grid 10 mm from each edge with equal settings between corner locations

Cycle Time

Program dependent, each measurement point approximately 1500 msec

Spectral Data

Reflectance as a function of wavelength

Colorimetric Data

Tristimulus 1931 X,Y,Z                   Tristimulus 1964 X,Y,Z                    CIE 1931 x,y         

CIE 1976 L*, a*, b*                         CIE 1976 L*, u*, v*

System Dimensions

1.25 meters H x 1.0 meters W x 1.0 meters D     Weight 300 kg

Operating Ranges

Ambient Temperature  0 to 35°C                           Relative Humidity < 90% non-condensing

Specifications are subject to change without notice.

  • 191F-1045 Dual Angle Gonioreflectometer Head, Configured for 10deg and 45deg Specular Inspection, Integrated Focus Adjustment with Laser Distance Sensor and Z Height Feedback, Halogen Source, 380-830nm Spectral Range.
  • GS-1220-1-RM Spectroradiometric measurement system (360-900 nm) with 2-meter fiber-optic probe, C342USB Interface, Rack Mountable
  • System controller - rack mount computer preconfigured with Gamma Scientific AR measurement software
  • RS-4-3-1667 precision lamp constant current power supply
  • On-site install; up to 2 Days of installation and training, includes travel expenses 

Related Products

RadOMA GS-1220 spectroradiometers provide a datapoint interval of 0.32 nm and are available in three wavelength ranges:

  • 250 to 900 nm
  • 360 to 900 nm
  • 360 to 1100 nm

 

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