VCSEL Test Systems

Vertical Cavity Surface Emitting Laser (VCSEL) technology is  a key enabler in applications such as facial mapping, gesture recognition, proximity sensing and optical communications.

In addition to their outstanding performance characteristics, the very nature of VCSEL construction enables testing at various phases of manufacture, increasing production yields, improving product performance and reducing cost.

With an experience base spanning more than 50 years in light measurement, Gamma Scientific is uniquely positioned to deliver precise, repeatable, and high speed optical and electrical test solutions for all performance characteristics of VCSEL devices, helping you deliver reliable, cost effective and high performance solutions to your customers.


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Unmatched Performance in VCSEL Test Solutions

  • Near field spot size and emission angles
  • Far field spot size and emission angles
  • Spatial uniformity and hotspot determination for regulatory & safety compliance
  • Absolute power measurement
  • Spectral parameters including peak, centroid & dominant wavelength
  • Electrical parameters including LIV, VF, VR and IR
  • Wall plug efficiency
  • Chromaticity and CCT values including CIE x,y


Key when purchasing metrology equipment is knowing  that the correct information is being collected.  Our experience operating an ISO 17025 compliant company and 3rd party NVLAP testing facility has allowed us to better anticipate the needs of users and eliminate common causes of measurement inaccuracy. The resulting systems leverage this knowledge to make software and hardware as universal as possible, with wafer level multi-channel test & characterization solutions for measurement in CW or pulsed operating modes.

Nominal Specifications

DUT Form Factor

Chip on Carrier, Chip on Submount, Wafer Level

Short-pulse Duty Cycle

Typically 1 msec, options to 100 µsec


Spectral Range

200 to 1100 nm     (Custom ranges available on request)

Wavelength Repeatability

0.03 nm

Wavelength Accuracy

± 0.2 nm

Spectral Sensor

Temperature stabilized back-thinned 1024 x 128 element CCD array

Electrical Resolution

16 bit

Dynamic Range

64,000:1 (single scan)

Optical Power Meter

Sensor Type

InGaAs  (Si or Ge available, specifications may differ)

Dynamic Range

-8.5 to + 3.5 dBm

Typical Response

9.5 x 10-1 A/W at 1550 nm

Calibration Range

800 to 1750nm

Current Ranges

Current Range

100 nA to 10A

Current Resolution

As low as 2 pA          (current range dependent)

Typical Noise (peak to peak)

As low as 5 pA          (current range dependent, 0.1 Hz to 10 Hz)

Voltage Ranges

Compliance Voltage Range

100 mV to 40 V

Programming Resolution

As low as 5 µV           (voltage range dependent)

Typical Noise (peak to peak)

As low as 20 µV          (voltage range dependent, 0.1 Hz to 10Hz)

Emission Angle Measurement Error

< 1°

Calibration Accreditation

ISO/IEC 17025 by NVLAP (NVLAP lab code 200823-0)

Control Software

Light Touch LED software for Windows via USB 2.0 interface

Includes binning and batch tracking functions

Specifications are subject to change without notice.

Systems are configured as customer needs dictate.  This is a sample system only.

Systems are typically custom configured


RS-7 WavemonTM   Real-time wavelength measurement system

The Wavelength Monitor System is a multi-channel photodiode system which provides amplitude feedback and real-time wavelength measurements. It consists of three photodiodes each with an independent transimpedance amplifier circuit. Proprietary optical filtering techniques allows for wavelength accuracy of +/-0.25nm and repeatability of +/-0.05nm. The Wavelength Monitor PCBA, photodiodes, and optical filter assembly is temperature stabilized using a Peltier cooler and thermistor in a PID feedback loop. 

RS-7 Wavemon Option


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